Mindteck | Wafer Report Server

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	Wafer Report Server

The Challenge

Customer's Wafer Defect Inspection tool provides wafer meterology information in various formats during different stages of wafer defect detection. Customer's Defect Classification tool has multiple interfaces to Wafer defect detection tool but the same is not available in third party wafer classification tools.

Mindteck's Approach


	Analyzed the data generated by defect detection tool.
	Designed and developed a Wafer Report server based on industry standard KLAT protocol that would provide a uniform interface to the customer's wafer defect detection tool.

The Benefits


	Project delivered on time in 4 months
	Customer is now able to position the wafer defect detection tool separately from the defect classification tool leading to more sales opportunities. Earlier customer had to offer the wafer defect detection tool along with the defect classification tool as a package to the end user.

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