Our customer required several iterations with end users of its wafer defect inspection tool to get the complete data logs of reported incidents. Also, some tool logs were available only on demand.

The customer decided to move the project to us after we successfully demonstrated our capabilities in:

	Build-Operate-Transfer (BOT)
	Remote team extension and C/C++ on VxWorks, QNX, WinNT/XP, Proprietary RTOS
	C#, .NET
	VC++ & MFC
	COM
	Java
	CVD, PVD, ECD, CMP, ALD, Etch, Wafer Inspection, Factory Automation

Based on the root cause analysis, we set to work on a viable fault data grabber. The fault data grabber we developed from ground up offered the tool user failure event/symptom selections; log tool dependencies associated with events; triggers for flushing log files to the HDD on the tool; log file packagings that support failure-reporting to the tool maker.

The customer has been banking on our solution for over six months now – and has reported noticeable improvements in end user satisfaction levels and turnaround time.