Our customer’s wafer defect inspection tool provides wafer meteorology information in various formats during various stages in wafer defect detection. The tool has multiple interfaces to the customer’s Defect Classification Tool. No such interface is possible with third party wafer classification tools. The customer turned to our team for a viable solution.

Our capability matrix was instrumental in the customer’s decision to work closely with us.

	Build-Operate-Transfer (BOT)
	Remote team extension and C/C++ on VxWorks, QNX, WinNT/XP, Proprietary RTOS
	C#, .NET
	VC++ & MFC
	COM
	Java
	CVD, PVD, ECD, CMP, ALD, Etch, Wafer Inspection, Factory Automation

Our dedicated team analyzed data generated by the defect detection tool. The team mooted the idea of designing/developing a wafer report server based on industry standard KLAT protocol. The server provided interfaces for third parties to the customer’s wafer defect detection tool. The project was completed in four months.

In the past, our customer would offer the wafer defect detection tool together with the defect classification tool as a bundled solution. Today the customer is able to decouple the wafer defect detection tool from the defect classification tool and market it separately.